Temperature dependence of silicon carrier effective masses with application to femtosecond reflectivity measurements

The conductivity effective masses of electrons and holes in Si are calculated for carrier temperatures from 1 to 3000 K. The temperature dependence of the electron mass is calculated by use of a phenomenological model of conduction-band nonparabolicity that has been fitted to experimental measurements of the dependence of the electron conductivity effective mass on carrier concentration. The hole mass is investigated by tightbinding calculations of the valence bands, which have been adjusted to match experimental values of the valence-band curvature parameters at the top of the valence band. The calculations are in excellent agreement with femtosecond-laser reflectivity measurements of the change in optical effective mass as hot carriers cool from 1550 to 300 K. © 2002 Optical Society of America OCIS codes: 160.4760, 320.7130, 160.6000, 320.2250.